The Sources of Knowledge and the Value of Academic Patents
AbstractThis paper aims at contributing to the literature on the determinants of patent value in two respects. It first puts forward new potential determinants of patent value which are mainly related to the identification of the institutional sources of knowledge and the geographical scope of patenting strategy. Second, it aims at validating the traditional and new determinants of patent value with academic patents. The empirical analysis focuses on 208 patent families applied by six main Belgian Universities. The patent value is approximated by the number of forward patent citations. The estimates confirm the role of most traditional determinants of patent value (e.g., backward citation and family size). Further, the new indicators underline the importance of identifying the institutional sources of knowledge. They provide a more in-depth view on the way non patent citations, backward patent citations, co-assignees, and the geographical scope for protection determine patent value. Policy implications emerge from these results, such as the benefit of local and international collaboration between public research organisations and the need to convince academic researchers with a high scientific profile in terms of publications to crystallize their tacit knowledge into high value academic patents.
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Bibliographic InfoPaper provided by Institute of Innovation Research, Hitotsubashi University in its series IIR Working Paper with number 03-24.
Length: 34 p.
Date of creation: Nov 2003
Date of revision:
Patent value; patent indicators; knowledge sources;
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- Eleftherios Sapsalis & Bruno Van Pottelsberghe, 2003.
"Insight into the patenting performance of Belgian universities,"
Brussels Economic Review,
ULB -- Universite Libre de Bruxelles, vol. 46(3), pages 37-58.
- Eleftherios Sapsalis & Bruno Van Pottelsberghe, 2004. "Insight into the patenting performance of Belgian universities," Working Papers CEB 04-009.RS, ULB -- Universite Libre de Bruxelles.
- Nicolas van Zeebroeck & Bruno Van Pottelsberghe & Wook Han, 2006.
"Issues in measuring the degree of technological specialisation with patent data,"
ULB Institutional Repository
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- Nicolas van Zeebroeck & Bruno Van Pottelsberghe & Wook Han, 2005. "Issues in measuring the degree of technological specialisation with patent data," Working Papers CEB 05-016.RS, ULB -- Universite Libre de Bruxelles.
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