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ICT externalities: measurement issues and their effects on output growth

Author

Listed:
  • Keungoui Kim

    (Handong Global University)

  • Ahmed Bounfour

    (Université Paris-Saclay, RITM - Réseaux Innovation Territoires et Mondialisation - Université Paris-Saclay)

  • Alberto Nonnis

    (Université Paris-Saclay)

  • Altay Özaygen

    (LITEM - Laboratoire en Innovation, Technologies, Economie et Management (EA 7363) - UEVE - Université d'Évry-Val-d'Essonne - Université Paris-Saclay - IMT-BS - Institut Mines-Télécom Business School - IMT - Institut Mines-Télécom [Paris], IMT-BS - Institut Mines-Télécom Business School - IMT - Institut Mines-Télécom [Paris])

Abstract

This chapter focuses on externalities that arise from ICT investment and how they impact productivity at the industrial level. Expanding on the model proposed by Basu et al. (2003), it contributes both conceptually and empirically. Conceptually, our modeling considers a number of ICT externalities, such as domestic and foreign externalities, inter-industry and intra-industry externalities, and inward and outward externalities, and accounts for the investment in a wide set of complementary intangible capital types, namely training, design, and organizational capital, that are important in order to correctly identify spillover effects and separate them from other intangible capital effects. Empirically, our panel dataset includes 15 European countries observed from 2000 to 2014. ICT externalities are evaluated via fixed-effects regressions. Our results support the positive effect of many ICT spillover types on productivity, with domestic spillovers having the greatest impact. Additionally, our analysis supports the idea that ICT impacts productivity mainly via spillovers, making the impact of direct investment insignificant when spillovers are included in the model.

Suggested Citation

  • Keungoui Kim & Ahmed Bounfour & Alberto Nonnis & Altay Özaygen, 2024. "ICT externalities: measurement issues and their effects on output growth," Post-Print hal-04464923, HAL.
  • Handle: RePEc:hal:journl:hal-04464923
    DOI: 10.4324/9781003324225-11
    as

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