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Holographic Convergent Electron Beam Diffraction (Cbed) Imaging Of Two-Dimensional Crystals

Author

Listed:
  • T. LATYCHEVSKAIA

    (Institute of Physics, Laboratory for Ultrafast, Microscopy and Electron Scattering (LUMES), École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland2Paul Scherrer Institute, Forschungsstrasse 111 5232 Villigen, Switzerland)

  • S. J. HAIGH

    (#x2020;National Graphene Institute, University of Manchester, Oxford Road, Manchester M13 9PL, UK‡Department of Materials, University of Manchester, Oxford Road, Manchester M13 9PL, UK)

  • K. S. NOVOSELOV

    (#x2020;National Graphene Institute, University of Manchester, Oxford Road, Manchester M13 9PL, UK§Department of Materials Science and Engineering, National University of Singapore, Singapore 117575, Singapore¶Centre for Advanced 2D Materials, National University of Singapore, 117546 Singapore, Singapore∥Chongqing 2D Materials Institute, Liangjiang New Area, Chongqing 400714, P. R. China)

Abstract

Convergent beam electron diffraction (CBED) performed on two-dimensional (2D) materials recently emerged as a powerful tool to study structural and stacking defects, adsorbates, atomic 3D displacements in the layers, and the interlayer distances. The formation of the interference patterns in individual CBED spots of 2D crystals can be considered as a hologram, thus the CBED patterns can be directly reconstructed by conventional reconstruction methods adapted from holography. In this study, we review recent results applying CBED to 2D crystals and their heterostructures: holographic CBED on bilayers with the reconstruction of defects and the determination of interlayer distance, CBED on 2D crystal monolayers to reveal adsorbates, and CBED on multilayered van der Waals systems with moiré patterns for local structural determination.

Suggested Citation

  • T. Latychevskaia & S. J. Haigh & K. S. Novoselov, 2021. "Holographic Convergent Electron Beam Diffraction (Cbed) Imaging Of Two-Dimensional Crystals," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 28(08), pages 1-15, August.
    • Handle: RePEc:wsi:srlxxx:v:28:y:2021:i:08:n:s0218625x21400011
    DOI: 10.1142/S0218625X21400011
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