IDEAS home Printed from https://ideas.repec.org/a/wsi/srlxxx/v25y2018i05ns0218625x18500981.html
   My bibliography  Save this article

Microstructures And High-Temperature Tribological Behaviors Of Magnetron Sputtered Dlc Coatings

Author

Listed:
  • WENCHANG WANG

    (School of Petrochemical Engineering, Changzhou University, Changzhou 213164, P. R. China)

  • LING ZHANG

    (#x2020;School of Mechanical Engineering, Changzhou University, Changzhou 213164, P. R. China)

  • DEJUN KONG

    (#x2021;Changzhou High Technology Research Key Laboratory of Mould Advanced Manufacturing, Changzhou University, Changzhou 213164, P. R. China)

Abstract

A diamond-like carbon (DLC) coating was deposited on YT14 cemented carbide cutting tools using an MS (magnetron sputtering), and the surface–interface morphologies, phases, and bonding energy of the obtained coatings were investigated using a scanning electron microscope (SEM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS), respectively. The wear behaviors of DLC coatings were measured using high temperature wear tests. The results show that the sp2 and sp3 appear at 284.4, and 285.3eV, respectively, the DLC coating is composed of the crystal planes (111) and (220). The average COF of DLC coatings at 750, 800, and 850∘C was 0.1956, 0.2082, and 0.4085, respectively, the wear depth increases with the wear temperatures increasing: At 750∘C, the diamond planes (111) and (222) remained, while at 800 and 850∘C, only the diamond plane (111) still remained, the diamond plane (220) was oxidized, resulting in wear capability decreasing. The wear mechanism was composed of abrasive wear, delamination, and oxidation wear.

Suggested Citation

  • Wenchang Wang & Ling Zhang & Dejun Kong, 2018. "Microstructures And High-Temperature Tribological Behaviors Of Magnetron Sputtered Dlc Coatings," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 25(05), pages 1-13, July.
    • Handle: RePEc:wsi:srlxxx:v:25:y:2018:i:05:n:s0218625x18500981
    DOI: 10.1142/S0218625X18500981
    as

    Download full text from publisher

    File URL: http://www.worldscientific.com/doi/abs/10.1142/S0218625X18500981
    Download Restriction: Access to full text is restricted to subscribers
    File URL: https://libkey.io/10.1142/S0218625X18500981?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:wsi:srlxxx:v:25:y:2018:i:05:n:s0218625x18500981. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Tai Tone Lim (email available below). General contact details of provider: http://www.worldscinet.com/srl/srl.shtml .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.