IDEAS home Printed from https://ideas.repec.org/a/wsi/srlxxx/v24y2017i03ns0218625x17500342.html
   My bibliography  Save this article

Impurity Induced Wrinkling Patterns In Metal Films Deposited On Soft Elastic Substrates

Author

Listed:
  • YONG-JU ZHANG

    (Department of Physics, Taizhou University, Linhai 317000, P. R. China)

  • SEN-JIANG YU

    (#x2020;Department of Physics, China Jiliang University, Hangzhou 310018, P. R. China)

  • MIAO-GEN CHEN

    (#x2020;Department of Physics, China Jiliang University, Hangzhou 310018, P. R. China)

  • PING-GEN CAI

    (#x2021;Department of Applied Physics, Zhejiang University of Technology, Hangzhou 310014, P. R. China)

  • HONG ZHOU

    (#x2020;Department of Physics, China Jiliang University, Hangzhou 310018, P. R. China)

Abstract

Metal (iron and nickel) films have been deposited on soft elastic polydimethylsiloxane (PDMS) substrates by direct current sputtering technique and the impurity induced wrinkling patterns are investigated by using optical microscopy and atomic force microscopy. It is found that the metal films can spontaneously form disordered wrinkles due to the isotropic compressive stress. In the vicinity of film impurities such as extraneous particles, linear defects, cracks and thickness-gradient film edges, the stress field becomes anisotropic owing to symmetry breaking and thus complex wrinkling patterns including straight stripes, herringbones, crossings, labyrinths and their transitions can be observed. The morphological evolutions, structural characteristics and physical mechanisms of the impurity induced wrinkles have been discussed and analyzed based on the continuum elastic theory.

Suggested Citation

  • Yong-Ju Zhang & Sen-Jiang Yu & Miao-Gen Chen & Ping-Gen Cai & Hong Zhou, 2017. "Impurity Induced Wrinkling Patterns In Metal Films Deposited On Soft Elastic Substrates," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 24(03), pages 1-7, April.
    • Handle: RePEc:wsi:srlxxx:v:24:y:2017:i:03:n:s0218625x17500342
    DOI: 10.1142/S0218625X17500342
    as

    Download full text from publisher

    File URL: http://www.worldscientific.com/doi/abs/10.1142/S0218625X17500342
    Download Restriction: Access to full text is restricted to subscribers
    File URL: https://libkey.io/10.1142/S0218625X17500342?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:wsi:srlxxx:v:24:y:2017:i:03:n:s0218625x17500342. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Tai Tone Lim (email available below). General contact details of provider: http://www.worldscinet.com/srl/srl.shtml .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.