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INVESTIGATION OF LEAKAGE CURRENT BEHAVIOR OFPt/Bi0.975La0.025Fe0.975Ni0.025O3/PtCAPACITOR MEASURED AT DIFFERENT TEMPERATURES

Author

Listed:
  • XIU HONG DAI

    (College of Information Engineering, Hebei University of Technology, Tianjin 300401, P. R. China)

  • HONG DONG ZHAO

    (College of Information Engineering, Hebei University of Technology, Tianjin 300401, P. R. China)

  • LEI ZHANG

    (College of Physics Science & Technology, Hebei University, Baoding 071002, P. R. China)

  • HUI JUAN ZHU

    (College of Physics Science & Technology, Hebei University, Baoding 071002, P. R. China)

  • XIAO HONG LI

    (College of Physics Science & Technology, Hebei University, Baoding 071002, P. R. China)

  • YA JUN ZHAO

    (College of Physics Science & Technology, Hebei University, Baoding 071002, P. R. China)

  • JIAN XIN GUO

    (College of Physics Science & Technology, Hebei University, Baoding 071002, P. R. China)

  • QING XUN ZHAO

    (College of Physics Science & Technology, Hebei University, Baoding 071002, P. R. China)

  • YING LONG WANG

    (College of Physics Science & Technology, Hebei University, Baoding 071002, P. R. China)

  • BAO TING LIU

    (College of Physics Science & Technology, Hebei University, Baoding 071002, P. R. China)

  • LIAN XI MA

    (Department of Physics, Blinn College, TX 77805, Bryan, USA)

Abstract

PolycrystallineBi0.975La0.025Fe0.975Ni0.025O3(BLFNO) film is fabricated onPt/Ti/SiO2/Si(111)substrate by sol–gel method. It is found that the well-crystallized BLFNO film is polycrystalline, and thePt/BLFNO/Ptcapacitor possesses good ferroelectric properties with remnant polarization of 74 μC/cm2at electric field of 833 kV/cm. Moreover, it is also found that the leakage current density of thePt/BLFNO/Ptcapacitor increases with the increase of measurement temperature ranging from 100 to 300 K. The leakage density of thePt/BLFNO/Ptcapacitor satisfies space-charge-limited conduction (SCLC) at higher electric field and shows little dependence on voltage polarity and temperature, but shows polarity and temperature dependence at lower applied electric field. With temperature increasing from 100 to 300 K at lower applied electric field, the most likely conduction mechanism is from Ohmic behavior to SCLC for positive biases, but no clear dominant mechanism for negative biases is shown.

Suggested Citation

  • Xiu Hong Dai & Hong Dong Zhao & Lei Zhang & Hui Juan Zhu & Xiao Hong Li & Ya Jun Zhao & Jian Xin Guo & Qing Xun Zhao & Ying Long Wang & Bao Ting Liu & Lian Xi Ma, 2014. "INVESTIGATION OF LEAKAGE CURRENT BEHAVIOR OFPt/Bi0.975La0.025Fe0.975Ni0.025O3/PtCAPACITOR MEASURED AT DIFFERENT TEMPERATURES," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 21(02), pages 1-7.
    • Handle: RePEc:wsi:srlxxx:v:21:y:2014:i:02:n:s0218625x14500292
    DOI: 10.1142/S0218625X14500292
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    Keywords

    BiFeO3; doping; temperature; leakage current;
    All these keywords.

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