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Edax Spectra As A Tool To Evaluate Structural, Compositional And Electrical Parameters

Author

Listed:
  • B. KAVITHA

    (PG and Research, Department of Physics, Kongunadu Arts and Science College, Coimbatore-641029, India)

  • M. DHANAM

    (PG and Research, Department of Physics, Kongunadu Arts and Science College, Coimbatore-641029, India)

Abstract

Near-stoichiometric and stoichiometricCu(InAl)Se2(CIAS) thin films have been prepared by successive ionic layer adsorption and reaction (SILAR) onto well-cleaned substrates. energy dispersive X-ray analysis (EDAX) spectra of the prepared thin films enabled to determine the film composition, stoichiometry nature, type of conductivity, lattice constants, volume of the unit cell and density of CIAS thin films. The estimated compositional, structural and electrical parameters are presented and discussed in this paper in detail.

Suggested Citation

  • B. Kavitha & M. Dhanam, 2012. "Edax Spectra As A Tool To Evaluate Structural, Compositional And Electrical Parameters," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 19(03), pages 1-7.
    • Handle: RePEc:wsi:srlxxx:v:19:y:2012:i:03:n:s0218625x12500266
    DOI: 10.1142/S0218625X12500266
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