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PREPARATION AND FERROELECTRIC PROPERTY OF (100)-ORIENTEDCa0.4Sr0.6Bi4Ti4O15THIN FILM ONPt/Ti/SiO2/SiSUBSTRATE

Author

Listed:
  • SUHUA FAN

    (College of Materials Science and Technology, Shandong Jianzhu University, Jinan 250101, China)

  • QUANDE CHE

    (College of Materials Science and Technology, Shandong Jianzhu University, Jinan 250101, China)

  • FENGQING ZHANG

    (College of Materials Science and Technology, Shandong Jianzhu University, Jinan 250101, China)

Abstract

The (100)-orientedCa0.4Sr0.6Bi4Ti4O15(C0.4S0.6BTi)thin film was successfully prepared by a sol-gel method onPt/Ti/SiO2/Sisubstrate. The orientation and formation of thin films under different annealing schedules were studied using XRD and SEM. XRD analysis indicated that (100)-orientedC0.4S0.6BTithin film with degree of orientation ofI(200)/I(119)= 1.60was prepared by preannealing the film at 400°C for 3 min followed by rapid thermal annealing at 800°C for 5 min. SEM analysis further indicated that the (100)-orientedC0.4S0.6BTithin film with a thickness of about 800 nm was mainly composed of equiaxed grains. The remanent polarization and coercive field of the film were 16.1 μC/cm2and 85 kV/cm, respectively.

Suggested Citation

  • Suhua Fan & Quande Che & Fengqing Zhang, 2010. "PREPARATION AND FERROELECTRIC PROPERTY OF (100)-ORIENTEDCa0.4Sr0.6Bi4Ti4O15THIN FILM ONPt/Ti/SiO2/SiSUBSTRATE," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 17(05n06), pages 445-449.
    • Handle: RePEc:wsi:srlxxx:v:17:y:2010:i:05n06:n:s0218625x10014351
    DOI: 10.1142/S0218625X10014351
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