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Wave Optical Treatment Of Surface Step Contrast In Low-Energy Electron Microscopy

Author

Listed:
  • S. M. KENNEDY

    (School of Physics, Monash University, Victoria 3800, Australia)

  • N. E. SCHOFIELD

    (School of Physics, Monash University, Victoria 3800, Australia)

  • D. M. PAGANIN

    (School of Physics, Monash University, Victoria 3800, Australia)

  • D. E. JESSON

    (School of Physics, Monash University, Victoria 3800, Australia)

Abstract

A wave optical treatment of surface step contrast in a low-energy electron microscopy (LEEM) is presented. The aberrations of an idealised LEEM imaging system are directly incorporated into a transfer function (TF) and image simulations of surface steps are evaluated in one and two dimensions. Under the special circumstances of a weak phase object, the simplified form of the contrast transfer function (CTF) is used to discuss LEEM image contrast and optimum defocus conditions.

Suggested Citation

  • S. M. Kennedy & N. E. Schofield & D. M. Paganin & D. E. Jesson, 2009. "Wave Optical Treatment Of Surface Step Contrast In Low-Energy Electron Microscopy," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 16(06), pages 855-867.
  • Handle: RePEc:wsi:srlxxx:v:16:y:2009:i:06:n:s0218625x09013402
    DOI: 10.1142/S0218625X09013402
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    1. T. Kizuka & N. Tanaka, 1996. "Time-Resolved Atomic Observation Of Fragmentation Process In Gold Clusters By High-Resolution Transmission Electron Microscopy," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 3(01), pages 1187-1190.
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