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An Investigation of the Native Oxide of Aluminum Alloy 7475-T7651 Using XPS, AES, TEM, EELS, GDOES and RBS

Author

Listed:
  • S. K. Toh

    (Department of Applied Physics, RMIT University, GPO Box 2476V, Melbourne, 3001, Australia)

  • D. G. McCulloch

    (Department of Applied Physics, RMIT University, GPO Box 2476V, Melbourne, 3001, Australia)

  • J. Du Plessis

    (Department of Applied Physics, RMIT University, GPO Box 2476V, Melbourne, 3001, Australia)

  • P. J. K. Paterson

    (Department of Applied Physics, RMIT University, GPO Box 2476V, Melbourne, 3001, Australia)

  • A. E. Hughes

    (Division of Manufacturing and Infrastructure Technology, Commonwealth Scientific and Industrial Research Organization, Private Bag 33 Clayton Sth MDC, Clayton, 3169, Australia)

  • D. Jamieson

    (School of Physics, The University of Melbourne, 3010, Australia)

  • B. Rout

    (School of Physics, The University of Melbourne, 3010, Australia)

  • J. M. Long

    (School of Engineering and Technology, Deakin University, Geelong, Victoria, 3217, Australia)

  • A. Stonham

    (Head of Research and Technology, BAE Systems Australia, 5112, Australia)

Abstract

The native oxide on the rolled aerospace aluminum alloy 7475-T7651 was characterized using a variety of different techniques, including X-ray Photoelectron Spectrometry (XPS), Auger Electron Spectrometry (AES), Transmission Electron Microscopy (TEM), Electron Energy Loss Spectrometry (EELS), Glow Discharge Optical Emission Spectrometry (GDOES), and Rutherford Backscattered Spectrometry (RBS). All techniques revealed that the native oxide layer is magnesium-rich and is probably a mixture of magnesium and aluminum–magnesium oxides.1The oxide layer was found to be of nonuniform thickness due to the rolling process involved during the manufacture of this sheet alloy; this complicates analysis using techniques which have poor spatial resolution. Direct thickness measurement from cross-sectional TEM reveals an oxide thickness which varies between 125 and 500 nm. This large variation in thickness was also evident from GDOES and AES depth profiles as well as the RBS data. Both XPS and RBS also show evidence for the presence of heavy metals in the oxide.

Suggested Citation

  • S. K. Toh & D. G. McCulloch & J. Du Plessis & P. J. K. Paterson & A. E. Hughes & D. Jamieson & B. Rout & J. M. Long & A. Stonham, 2003. "An Investigation of the Native Oxide of Aluminum Alloy 7475-T7651 Using XPS, AES, TEM, EELS, GDOES and RBS," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 10(02n03), pages 365-371.
    • Handle: RePEc:wsi:srlxxx:v:10:y:2003:i:02n03:n:s0218625x0300530x
    DOI: 10.1142/S0218625X0300530X
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