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Excitonic Side Bands Of Inner-Shell Excitations In Rare Gas Solids

Author

Listed:
  • S. VIELHAUER

    (II. Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany)

  • M. KIRM

    (II. Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany)

  • V. KISAND

    (II. Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany)

  • E. NEGODIN

    (II. Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany)

  • E. SOMBROWSKI

    (II. Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany)

  • B. STEEG

    (II. Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany)

  • G. ZIMMERER

    (II. Institut für Experimentalphysik, Universität Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany)

Abstract

Valence-exciton luminescence under inner-shell excitation of the rare gas solids Xe, Kr, and Ar has been measured using time-resolved photoluminescence. Two different processes for exciton creation can be distinguished: creation of "prompt" excitons immediately after excitation (within the experimental time resolution), and creation of "delayed" excitons through electron–hole recombination. The decay structure of the exciton emission in the range of inner-shell excitation is characterized by the coexistence of the two processes. Time-resolved excitation spectra near the2pedge in Ar, the3dedge in Kr, and the4dedge in Xe are discussed. The process of prompt exciton creation is strongly enhanced above an excitation threshold at the energy position of the ionization limit of the core state plus the energy of the valence free exciton.

Suggested Citation

  • S. Vielhauer & M. Kirm & V. Kisand & E. Negodin & E. Sombrowski & B. Steeg & G. Zimmerer, 2002. "Excitonic Side Bands Of Inner-Shell Excitations In Rare Gas Solids," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(02), pages 1333-1338.
    • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x02003767
    DOI: 10.1142/S0218625X02003767
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