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X-Ray Raman Scattering From Lowzmaterials

Author

Listed:
  • MICHAEL KRISCH

    (European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France)

  • FRANCESCO SETTE

    (European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France)

Abstract

X-ray Raman scattering from core electrons of lowZmaterials provides an alternative to soft X-ray absorption spectroscopy in cases where (i) exotic final states will be probed, (ii) the penetrating power of hard X rays is needed to study bulk properties, and (iii) when systems under high pressure are studied. The theoretical background and experimental requirements are discussed. The present capabilities of the technique are illustrated by two experiments, performed on the inelastic X ray scattering beamlines at the European Synchrotron Radiation Facility.

Suggested Citation

  • Michael Krisch & Francesco Sette, 2002. "X-Ray Raman Scattering From Lowzmaterials," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(02), pages 969-976.
    • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x02001689
    DOI: 10.1142/S0218625X02001689
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