Author
Listed:
- SATORU SUZUKI
(NTT Basic Research Laboratories, Atsugi, Kanagawa, 243-0198, Japan)
- Y. WATANABE
(NTT Basic Research Laboratories, Atsugi, Kanagawa, 243-0198, Japan)
- T. KIYOKURA
(NTT Basic Research Laboratories, Atsugi, Kanagawa, 243-0198, Japan)
- K. G. NATH
(NTT Basic Research Laboratories, Atsugi, Kanagawa, 243-0198, Japan)
- T. OGINO
(NTT Basic Research Laboratories, Atsugi, Kanagawa, 243-0198, Japan)
- S. HEUN
(Sincrotrone Trieste, Basovizza, 34012 Trieste, Italy)
- W. ZHU
(Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974, USA)
- C. BOWER
(Department of Physics and Astronomy and Curriculum in Applied and Materials Science, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599, USA)
- O. ZHOU
(Department of Physics and Astronomy and Curriculum in Applied and Materials Science, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599, USA)
Abstract
Electronic structural changes in multiwalled carbon nanotubes caused by adsorbates and Cs deposition were studied by photoemission spectroscopy. The adsorbates formed by air exposure slightly increased the work function. The increased work function is considered to be due to the surface dipole moment induced by the negatively charged adsorbates. On the other hand, the Cs deposition followed by the intercalation drastically decreased the work function. The results suggest that field emission current enhancement induced by adsorbates and by Cs deposition are based on essentially different mechanisms; that is, the former is associated with the formation of localized electronic states and the latter is mainly due to the work function decrease.
Suggested Citation
Satoru Suzuki & Y. Watanabe & T. Kiyokura & K. G. Nath & T. Ogino & S. Heun & W. Zhu & C. Bower & O. Zhou, 2002.
"EFFECTS OF AIR EXPOSURE AND CsDEPOSITION ON THE ELECTRONIC STRUCTURE OF MULTIWALLED CARBON NANOTUBES,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(01), pages 431-435.
Handle:
RePEc:wsi:srlxxx:v:09:y:2002:i:01:n:s0218625x02002427
DOI: 10.1142/S0218625X02002427
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