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X-Ray Magnetic Circular Dichroism Imaging In A Low Energy Electron Microscope

Author

Listed:
  • A. LOCATELLI

    (Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy)

  • S. CHERIFI

    (Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy;
    IPCMS-GSI 23, rue du Loess, 67037 Strasbourg, France)

  • S. HEUN

    (Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy)

  • M. MARSI

    (Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy)

  • K. ONO

    (Graduate School of Engineering, University of Tokyo, Tokyo 113-8656, Japan)

  • A. PAVLOVSKA

    (Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy;
    Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USA)

  • E. BAUER

    (Sincrotrone Trieste, S.S.14, km 163.5, 34012 Basovizza, Trieste, Italy;
    Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USA)

Abstract

The magnetic domain structure of patterned permalloy films and of a Co(0001) single crystal surface are studied with elliptically polarized light from the new nanospectroscopy beamline at ELETTRA in a low energy electron microscope, using it as a diagnostic tool in the commissioning phase of the beamline. Mirror and low energy electron microscopy as well as low energy electron diffraction are shown to be valuable fast techniques for system alignment and specimen characterization.

Suggested Citation

  • A. Locatelli & S. Cherifi & S. Heun & M. Marsi & K. Ono & A. Pavlovska & E. Bauer, 2002. "X-Ray Magnetic Circular Dichroism Imaging In A Low Energy Electron Microscope," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(01), pages 171-176.
    • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:01:n:s0218625x02001896
    DOI: 10.1142/S0218625X02001896
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