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Measurements Of Auger Electron Diffraction Using A 180° Deflection Toroidal Analyzer

Author

Listed:
  • SUSUMU SHIRAKI

    (Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106-8558, Japan)

  • HIDESHI ISHII

    (Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106-8558, Japan)

  • YOSHIMASA NIHEI

    (Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106-8558, Japan)

  • MASANORI OWARI

    (Environmental Science Center, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan)

Abstract

A 180° deflection toroidal analyzer is a novel electron spectrometer, which allows the simultaneous registration of the wide range of polar angles in a given azimuth of the sample. Therefore, measurements of photo- and Auger electron intensities over π steradians can be performed rapidly by azimuthal rotation of the sample. Using this analyzer, two-dimensional patterns of electron-beam-excited O KVV and Mg KVV Auger electron diffraction (AED) from a MgO(001) surface were measured in short acquisition times. The AED patterns obtained were compared with theoretical ones calculated by the multiple-scattering scheme. The agreement between experimental and theoretical data was good for both O KVV and Mg KVV transitions.

Suggested Citation

  • Susumu Shiraki & Hideshi Ishii & Yoshimasa Nihei & Masanori Owari, 1999. "Measurements Of Auger Electron Diffraction Using A 180° Deflection Toroidal Analyzer," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 6(05), pages 585-590.
  • Handle: RePEc:wsi:srlxxx:v:06:y:1999:i:05:n:s0218625x99000536
    DOI: 10.1142/S0218625X99000536
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