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Electron Momentum Spectroscopy Of Surfaces

Author

Listed:
  • S. TIXIER

    (AMPEL, Department of Physics and Astronomy, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada;
    Department of Chemistry, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada)

  • Y. ZHENG

    (Department of Chemistry, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada)

  • T. TIEDJE

    (AMPEL, Department of Physics and Astronomy, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada;
    Also Department of Electrical and Computer Engineering, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada)

  • G. COOPER

    (Department of Chemistry, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada)

  • C. E. BRION

    (Department of Chemistry, University of British Columbia, Vancouver, B.C. V6T 1Z1, Canada)

Abstract

Electron momentum spectroscopy [binary (e,2e) spectroscopy] using transmission geometry is a unique experimental tool for imaging the electron momentum distribution in gas phase samples as well as in thin films. In a solid, the electron momentum distribution is related to the band structure. Development of the (e,2e) technique using a more versatile reflection geometry is attractive since a much wider range of surfaces could be studied. The design of a new reflection (e,2e) spectrometer is presented. It is based on a two-step scattering model in which an incident electron successively reflects and ejects a valence electron from the surface. The scattered and ejected electrons are detected in coincidence and their energies and momentum vectors are simultaneously determined using a high throughput 90° truncated spherical electrostatic analyzer and position-sensitive detectors.

Suggested Citation

  • S. Tixier & Y. Zheng & T. Tiedje & G. Cooper & C. E. Brion, 1999. "Electron Momentum Spectroscopy Of Surfaces," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 6(05), pages 579-584.
    • Handle: RePEc:wsi:srlxxx:v:06:y:1999:i:05:n:s0218625x99000524
    DOI: 10.1142/S0218625X99000524
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