Author
Listed:
- Th. Schmidt
(ELETTRA, Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy)
- S. Heun
(ELETTRA, Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy)
- J. Slezak
(ELETTRA, Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy)
- J. Diaz
(ELETTRA, Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy)
- K. C. Prince
(ELETTRA, Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy)
- G. Lilienkamp
(Physikalisches Institut, Technische Universität Clausthal, 38678 Clausthal-Zellerfeld, Germany)
- E. Bauer
(Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504, USA)
Abstract
At present the only surface electron microscope which allows true characteristic XPEEM (photoemission electron microscopy using synchrotron radiation) and structural characterization is the spectroscopic LEEM developed at the Technical University Clausthal in the early nineties. This instrument has in the past been used mainly for LEEM studies of various surface and thin film phenomena, because it had very limited access to synchrotron radiation. Now the microscope is connected quasipermanently to the undulator beamline 6.2 at the storage ring ELETTRA, operating successfully since the end of 1996 under the name SPELEEM (Spectroscopic PhotoEmission and Low Energy Electron Microscope). The high brightness of the ELETTRA light source, together with an optimized instrument, results in a spatial resolution better than 25 nm and an energy resolution better than 0.5 eV in the XPEEM mode. The instrument can be used alternately for XPEEM, LEEM, LEED (low energy electron diffraction), MEM (mirror electron microscopy) and other imaging modes, depending upon the particular problem studied. The combination of these imaging modes allows a comprehensive characterization of the specimen. This is of particular importance when the chemical identification of structurar features is necessary for the understanding of a surface or thin film process. In addition, PED (photoelectron diffraction) and VPEAD (valence photoelectron angular distribution) of small selected areas give local atomic configuration and band structure information, respectively.
Suggested Citation
Th. Schmidt & S. Heun & J. Slezak & J. Diaz & K. C. Prince & G. Lilienkamp & E. Bauer, 1998.
"SPELEEM: Combining LEEM and Spectroscopic Imaging,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 5(06), pages 1287-1296.
Handle:
RePEc:wsi:srlxxx:v:05:y:1998:i:06:n:s0218625x98001626
DOI: 10.1142/S0218625X98001626
Download full text from publisher
As the access to this document is restricted, you may want to search for a different version of it.
Corrections
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:wsi:srlxxx:v:05:y:1998:i:06:n:s0218625x98001626. See general information about how to correct material in RePEc.
If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.
We have no bibliographic references for this item. You can help adding them by using this form .
If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Tai Tone Lim (email available below). General contact details of provider: http://www.worldscinet.com/srl/srl.shtml .
Please note that corrections may take a couple of weeks to filter through
the various RePEc services.