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Surface Transmission Electron Microscopy On Structures With Truncation

Author

Listed:
  • KUNIO TAKAYANAGI

    (Tokyo Institute of Technology, 4259 Midori-ku, Nagatsuta, Yokohama, 226, Japan)

  • YOSHITAKA NAITOH

    (Tokyo Institute of Technology, 4259 Midori-ku, Nagatsuta, Yokohama, 226, Japan)

  • YOSHIFUMI OSHIMA

    (Tokyo Institute of Technology, 4259 Midori-ku, Nagatsuta, Yokohama, 226, Japan)

  • MASANORI MITOME

    (Tokyo Institute of Technology, 4259 Midori-ku, Nagatsuta, Yokohama, 226, Japan;
    National Institute for Research in Inorganic Materials, 1-1 Namiki, Tsukuba, 305, Japan)

Abstract

Surface transmission electron microscopy (TEM) has been used to reveal surface steps and structures by bright and dark field imaging, and high resolution plan view and/or profile view imaging. Dynamic processes on surfaces, such as step motion, surface phase transitions and film growths, are visualized by a TV system attached to the electron microscope. Atom positions can precisely be detected by convergent beam illumination (CBI) of high resolution surface TEM. Imaging of the atomic positions of surfaces with truncation is briefly reviewed in this paper, with recent development of a TEM–STM (scanning tunneling microscope) system.

Suggested Citation

  • Kunio Takayanagi & Yoshitaka Naitoh & Yoshifumi Oshima & Masanori Mitome, 1997. "Surface Transmission Electron Microscopy On Structures With Truncation," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 4(04), pages 687-694.
    • Handle: RePEc:wsi:srlxxx:v:04:y:1997:i:04:n:s0218625x97000687
    DOI: 10.1142/S0218625X97000687
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