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Defects Of A15 Small Particles In Tungsten Thin Films

Author

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  • MASASHI ARITA

    (School of Engineering and Furo-cho Chikusa-ku, Nagoya 464–01, Japan)

  • ISAO NISHIDA

    (Faculty of Science, Nagoya University, Furo-cho Chikusa-ku, Nagoya 464–01, Japan)

Abstract

Crystal defects of A15 small particles in tungsten thin films were studied by means of transmission electron microscopy. Defects found in nanoscale crystals were analyzed to have special structure containing theZr4Al3-type structure unit.

Suggested Citation

  • Masashi Arita & Isao Nishida, 1996. "Defects Of A15 Small Particles In Tungsten Thin Films," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 3(01), pages 1191-1194.
    • Handle: RePEc:wsi:srlxxx:v:03:y:1996:i:01:n:s0218625x9600214x
    DOI: 10.1142/S0218625X9600214X
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