Author
Listed:
- N.H. TOLK
(Center for Molecular and Atomic Studies at Surfaces, Department of Physics and Astronomy, Vanderbilt University, Nashville, TN 37235, USA)
- J.T. MCKINLEY
(Center for Molecular and Atomic Studies at Surfaces, Department of Physics and Astronomy, Vanderbilt University, Nashville, TN 37235, USA)
- G. MARGARITONDO
(Center for Molecular and Atomic Studies at Surfaces, Department of Physics and Astronomy, Vanderbilt University, Nashville, TN 37235, USA;
Institut de Physique Appliquée, Ecole Polytechnique Fédérle, CH-1015 Lausanne, Switzerland)
Abstract
Synchrotron-radiation sources have become, since the late 1960’s, one of the fundamental experimental tools for surface and interface research. Only recently, however, a related type of photon sources - the free-electron lasers (FELs) — has begun to make important contributions to this field. For example, FELs have been used to reach unprecedented levels of accuracy and reliability in measuring semiconductor interface energy barriers. We review some of the present and proposed experiments that are made possible by the unmatched brightness and broad tunability of infrared FELs. Practical examples discussed in the review are supplied by our own programs at the Vanderbilt Free-Electron Laser. We also briefly analyze the possible future development of FELs and of their applications to surface and interface research, in particular, the possibility of x-ray FELs.
Suggested Citation
N.H. Tolk & J.T. Mckinley & G. Margaritondo, 1995.
"Free-Electron Laser Spectroscopy Of Surfaces And Interfaces,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 2(04), pages 501-512.
Handle:
RePEc:wsi:srlxxx:v:02:y:1995:i:04:n:s0218625x95000479
DOI: 10.1142/S0218625X95000479
Download full text from publisher
As the access to this document is restricted, you may want to search for a different version of it.
Corrections
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:wsi:srlxxx:v:02:y:1995:i:04:n:s0218625x95000479. See general information about how to correct material in RePEc.
If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.
We have no bibliographic references for this item. You can help adding them by using this form .
If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Tai Tone Lim (email available below). General contact details of provider: http://www.worldscinet.com/srl/srl.shtml .
Please note that corrections may take a couple of weeks to filter through
the various RePEc services.