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EPITAXIAL GROWTH OF AuON Pt(011) STUDIED WITH X-RAY PHOTOELECTRON DIFFRACTION

Author

Listed:
  • A. STUCK

    (Physikalisches Institut der Universität Fribourg, Perolles, CH-1700 Fribourg, Switzerland)

  • R. FASEL

    (Physikalisches Institut der Universität Fribourg, Perolles, CH-1700 Fribourg, Switzerland)

  • J. OSTERWALDER

    (Physikalisches Institut der Universität Fribourg, Perolles, CH-1700 Fribourg, Switzerland)

  • L. SCHLAPBACH

    (Physikalisches Institut der Universität Fribourg, Perolles, CH-1700 Fribourg, Switzerland)

Abstract

Au films 0.24 to 5.9 monolayers thick were evaporated on Pt(011), and the growth mode was investigated with X-ray photoelectron diffraction. At 0.5 monolayer coverage most Au atoms are found in the second layer below the surface while a few atoms diffuse as far as four layers deep even though Au is not miscible with Pt in the bulk at low concentrations. With increasing coverage the missing rows of the Pt(011)(2×1)reconstruction are gradually filled by replaced Pt atoms and further Au atoms, but the top layer relaxation is not changed significantly. At high coverages Au grows epitaxially as Au(011) on the Pt(011) surface and exhibits a poorly developed missing-row reconstruction.

Suggested Citation

  • A. Stuck & R. Fasel & J. Osterwalder & L. Schlapbach, 1994. "EPITAXIAL GROWTH OF AuON Pt(011) STUDIED WITH X-RAY PHOTOELECTRON DIFFRACTION," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 1(02n03), pages 229-237.
    • Handle: RePEc:wsi:srlxxx:v:01:y:1994:i:02n03:n:s0218625x94000230
    DOI: 10.1142/S0218625X94000230
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