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Applications Of Synchrotron X-Ray Microtomography To Mesoscale Materials

Author

Listed:
  • G. T. SEIDLER

    (Physics Department, University of Washington, Seattle, Washington 98195-1560, USA)

  • L. J. ATKINS

    (Physics Department, University of Washington, Seattle, Washington 98195-1560, USA)

  • E. A. BEHNE

    (Physics Department, University of Washington, Seattle, Washington 98195-1560, USA)

  • U. NOOMNARM

    (Physics Department, University of Florida, Gainesville, Florida 32611, USA)

  • S. A. KOEHLER

    (Division of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138, USA)

  • R. R. GUSTAFSON

    (Forest Resources, University of Washington, Seattle, Washington 98195-2100, USA)

  • W. T. MCKEAN

    (Forest Resources, University of Washington, Seattle, Washington 98195-2100, USA)

Abstract

We discuss the application of synchrotron X-ray microtomography (XMT) to granular matter, foams, crumpled membranes, and paper. XMT provides rapid, high-resolution, fully three-dimensional characterization of each of these classes of material. In some cases, subsequent three-dimensional image processing allows the virtual reconstruction of the disordered material as a specified assemblage of idealized basic structural units. This allows measurement of otherwise inaccessible correlation functions and can also be used as the starting point for data-initiated simulations.

Suggested Citation

  • G. T. Seidler & L. J. Atkins & E. A. Behne & U. Noomnarm & S. A. Koehler & R. R. Gustafson & W. T. Mckean, 2001. "Applications Of Synchrotron X-Ray Microtomography To Mesoscale Materials," Advances in Complex Systems (ACS), World Scientific Publishing Co. Pte. Ltd., vol. 4(04), pages 481-490.
    • Handle: RePEc:wsi:acsxxx:v:04:y:2001:i:04:n:s0219525901000371
    DOI: 10.1142/S0219525901000371
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