IDEAS home Printed from https://ideas.repec.org/a/taf/uiiexx/v55y2022i2p129-146.html
   My bibliography  Save this article

A new class of mechanism-equivalence-based Wiener process models for reliability analysis

Author

Listed:
  • Han Wang
  • Haitao Liao
  • Xiaobing Ma
  • Rui Bao
  • Yu Zhao

Abstract

It is quite common to see that a unit of a product with a higher degradation rate also presents a more prominent dispersion. This phenomenon has motivated studies on developing new degradation models. In particular, a variety of Wiener process models have been developed by correlating the drift parameter and the diffusion parameter based on the statistical features of data. However, no insightful explanations are provided for such interesting correlations. In this article, degradation mechanism equivalence is first introduced based on the acceleration factor invariant principle, and the correlation between degradation rate and variation is explained using basic principles. Then, mechanism-equivalence-based Wiener process models, including a basic model and a random-effects model, are proposed to characterize such degradation behavior of a product. Analytical solutions for both point estimation and interval estimation of unknown model parameters are obtained using the maximum likelihood estimation method and an expectation–maximization algorithm. An extension of the proposed model that is able to handle accelerated degradation tests is developed. A simulation study and two real-world applications are provided to illustrate the effectiveness of the proposed models in product reliability estimation based on degradation data.

Suggested Citation

  • Han Wang & Haitao Liao & Xiaobing Ma & Rui Bao & Yu Zhao, 2022. "A new class of mechanism-equivalence-based Wiener process models for reliability analysis," IISE Transactions, Taylor & Francis Journals, vol. 55(2), pages 129-146, November.
  • Handle: RePEc:taf:uiiexx:v:55:y:2022:i:2:p:129-146
    DOI: 10.1080/24725854.2021.2000075
    as

    Download full text from publisher

    File URL: http://hdl.handle.net/10.1080/24725854.2021.2000075
    Download Restriction: Access to full text is restricted to subscribers.

    File URL: https://libkey.io/10.1080/24725854.2021.2000075?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:taf:uiiexx:v:55:y:2022:i:2:p:129-146. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Chris Longhurst (email available below). General contact details of provider: http://www.tandfonline.com/uiie .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.