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Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes

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  • Chih-chun Tsai
  • Chien-tai Lin

Abstract

Manufacturers are often faced with the problem of how to select the most reliable design among several competing designs in the stage of development. It becomes complicated if products are highly reliable. Under the circumstances, recent work has focused on the study with degradation data by assuming that degradation paths follow Wiener processes or random-effect models. However, it is more appropriate to use gamma processes to model degradation data with monotone-increasing pattern. This article deals with the selection problem for such processes. With a minimum probability of correct decision, optimal test plans can be obtained by minimizing the total cost.

Suggested Citation

  • Chih-chun Tsai & Chien-tai Lin, 2014. "Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes," Communications in Statistics - Theory and Methods, Taylor & Francis Journals, vol. 43(10-12), pages 2419-2428, May.
    • Handle: RePEc:taf:lstaxx:v:43:y:2014:i:10-12:p:2419-2428
    DOI: 10.1080/03610926.2013.804562
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    Cited by:

    1. Jingyuan Shen & Alaa Elwany & Lirong Cui, 2018. "Reliability modeling for systems degrading in K cyclical regimes based on gamma processes," Journal of Risk and Reliability, , vol. 232(6), pages 754-765, December.

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