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Runs rules schemes for monitoring process variability

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  • Demetrios Antzoulakos
  • Athanasios Rakitzis

Abstract

To increase the sensitivity of Shewhart control charts in detecting small process shifts sensitizing rules based on runs and scans are often used in practice. Shewhart control charts supplemented with runs rules for detecting shifts in process variance have not received as much attention as their counterparts for detecting shifts in process mean. In this article, we examine the performance of simple runs rules schemes for monitoring increases and/or decreases in process variance based on the sample standard deviation. We introduce one-sided S charts that overcome the weakness of high false-alarm rates when runs rules are added to a Shewhart control chart. The average run length performance and design aspects of the charts are studied thoroughly. The performance of associated two-sided control schemes is investigated as well.

Suggested Citation

  • Demetrios Antzoulakos & Athanasios Rakitzis, 2010. "Runs rules schemes for monitoring process variability," Journal of Applied Statistics, Taylor & Francis Journals, vol. 37(7), pages 1231-1247.
    • Handle: RePEc:taf:japsta:v:37:y:2010:i:7:p:1231-1247
    DOI: 10.1080/02664760903002683
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    References listed on IDEAS

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    1. M. V. Koutras & S. Bersimis & P. E. Maravelakis, 2007. "Statistical Process Control using Shewhart Control Charts with Supplementary Runs Rules," Methodology and Computing in Applied Probability, Springer, vol. 9(2), pages 207-224, June.
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    Cited by:

    1. Sotirios Bersimis & Athanasios Sachlas & Philippe Castagliola, 2017. "Controlling Bivariate Categorical Processes using Scan Rules," Methodology and Computing in Applied Probability, Springer, vol. 19(4), pages 1135-1149, December.
    2. Jungtaek Oh & Christian H. Weiß, 2020. "On the Individuals Chart with Supplementary Runs Rules under Serial Dependence," Methodology and Computing in Applied Probability, Springer, vol. 22(3), pages 1257-1273, September.

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