IDEAS home Printed from https://ideas.repec.org/a/spr/joinma/v33y2022i5d10.1007_s10845-020-01730-7.html
   My bibliography  Save this article

Serial number inspection for ceramic membranes via an end-to-end photometric-induced convolutional neural network framework

Author

Listed:
  • Feiyang Li

    (Guangdong University of Technology)

  • Nian Cai

    (Guangdong University of Technology
    Huizhou Guangdong University of Technology IoT Cooperative Innovation Institute Co., Ltd.)

  • Xueliang Deng

    (Guangdong University of Technology)

  • Jiahao Li

    (Guangdong University of Technology)

  • Jianfa Lin

    (Foshan Deeple Vision Technology Co. Ltd.)

  • Han Wang

    (Guangdong University of Technology)

Abstract

The ceramic membrane plays an important role in the wastewater disposal industry. The serial number engraved on each ceramic membrane is an essential feature for identification. Here, an automatic inspection system for serial numbers of ceramic membranes is proposed to replace the manual inspection. To the best of our knowledge, this is the first attempt to automatically inspect serial numbers of ceramic membranes. To suppress error accumulation inherently existed in the previous stepwise approaches, an end-to-end photometric-induced convolutional neural network framework is proposed for this automatic inspection system. The framework consists of three sequential stages, which are photometric stage for performing photometric stereo, localization stage for localizing the text region, and recognition stage for producing recognition results. The photometric stage can integrate three-dimensional shape information of serial numbers of ceramic membranes into the framework to improve the inspection performance. Since three stages are jointly trained, a theoretical analysis on the contributions of the local losses is provided to ensure the convergence of the framework, which can guide the design of the total loss function of the framework. Experimental results demonstrate that the proposed framework achieves better inspection performance with a reasonable inspection time compared with the state-of-the-art deep learning methods, whose localization performance and recognition performance are the F-score of 95.61% and the accuracy of 96.49%, respectively. Furthermore, these demonstrate the potential that our proposed automatic inspection system will be beneficial for the intelligentialize of the ceramic membrane manufacturing and wastewater treatment if it is equipped with a perception system and a control system in ceramic membrane production lines and wastewater treatment processes.

Suggested Citation

  • Feiyang Li & Nian Cai & Xueliang Deng & Jiahao Li & Jianfa Lin & Han Wang, 2022. "Serial number inspection for ceramic membranes via an end-to-end photometric-induced convolutional neural network framework," Journal of Intelligent Manufacturing, Springer, vol. 33(5), pages 1373-1392, June.
  • Handle: RePEc:spr:joinma:v:33:y:2022:i:5:d:10.1007_s10845-020-01730-7
    DOI: 10.1007/s10845-020-01730-7
    as

    Download full text from publisher

    File URL: http://link.springer.com/10.1007/s10845-020-01730-7
    File Function: Abstract
    Download Restriction: Access to the full text of the articles in this series is restricted.

    File URL: https://libkey.io/10.1007/s10845-020-01730-7?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    References listed on IDEAS

    as
    1. Hui Lin & Bin Li & Xinggang Wang & Yufeng Shu & Shuanglong Niu, 2019. "Automated defect inspection of LED chip using deep convolutional neural network," Journal of Intelligent Manufacturing, Springer, vol. 30(6), pages 2525-2534, August.
    2. Ohyung Kwon & Hyung Giun Kim & Min Ji Ham & Wonrae Kim & Gun-Hee Kim & Jae-Hyung Cho & Nam Il Kim & Kangil Kim, 2020. "A deep neural network for classification of melt-pool images in metal additive manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 31(2), pages 375-386, February.
    3. Olatomiwa Badmos & Andreas Kopp & Timo Bernthaler & Gerhard Schneider, 2020. "Image-based defect detection in lithium-ion battery electrode using convolutional neural networks," Journal of Intelligent Manufacturing, Springer, vol. 31(4), pages 885-897, April.
    4. Domen Tabernik & Samo Šela & Jure Skvarč & Danijel Skočaj, 2020. "Segmentation-based deep-learning approach for surface-defect detection," Journal of Intelligent Manufacturing, Springer, vol. 31(3), pages 759-776, March.
    Full references (including those not matched with items on IDEAS)

    Most related items

    These are the items that most often cite the same works as this one and are cited by the same works as this one.
    1. Swarit Anand Singh & K. A. Desai, 2023. "Automated surface defect detection framework using machine vision and convolutional neural networks," Journal of Intelligent Manufacturing, Springer, vol. 34(4), pages 1995-2011, April.
    2. Zhenxing Cheng & Hu Wang & Gui-Rong Liu, 2021. "Deep convolutional neural network aided optimization for cold spray 3D simulation based on molecular dynamics," Journal of Intelligent Manufacturing, Springer, vol. 32(4), pages 1009-1023, April.
    3. Nhat-To Huynh & Duong-Dong Ho & Hong-Nguyen Nguyen, 2023. "An Approach for Designing an Optimal CNN Model Based on Auto-Tuning GA with 2D Chromosome for Defect Detection and Classification," Sustainability, MDPI, vol. 15(6), pages 1-14, March.
    4. Shuo Meng & Ruru Pan & Weidong Gao & Jian Zhou & Jingan Wang & Wentao He, 2021. "A multi-task and multi-scale convolutional neural network for automatic recognition of woven fabric pattern," Journal of Intelligent Manufacturing, Springer, vol. 32(4), pages 1147-1161, April.
    5. Zeqing Yang & Mingxuan Zhang & Yingshu Chen & Ning Hu & Lingxiao Gao & Libing Liu & Enxu Ping & Jung Il Song, 2024. "Surface defect detection method for air rudder based on positive samples," Journal of Intelligent Manufacturing, Springer, vol. 35(1), pages 95-113, January.
    6. Chia-Yu Hsu & Ju-Chien Chien, 2022. "Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification," Journal of Intelligent Manufacturing, Springer, vol. 33(3), pages 831-844, March.
    7. Yuanyuan Wang & Ling Ma & Lihua Jian & Huiqin Jiang, 2023. "Conductive particle detection via efficient encoder–decoder network," Journal of Intelligent Manufacturing, Springer, vol. 34(8), pages 3563-3577, December.
    8. Ruiyang Hao & Bingyu Lu & Ying Cheng & Xiu Li & Biqing Huang, 2021. "A steel surface defect inspection approach towards smart industrial monitoring," Journal of Intelligent Manufacturing, Springer, vol. 32(7), pages 1833-1843, October.
    9. Omid Davtalab & Ali Kazemian & Xiao Yuan & Behrokh Khoshnevis, 2022. "Automated inspection in robotic additive manufacturing using deep learning for layer deformation detection," Journal of Intelligent Manufacturing, Springer, vol. 33(3), pages 771-784, March.
    10. Saksham Jain & Gautam Seth & Arpit Paruthi & Umang Soni & Girish Kumar, 2022. "Synthetic data augmentation for surface defect detection and classification using deep learning," Journal of Intelligent Manufacturing, Springer, vol. 33(4), pages 1007-1020, April.
    11. José M. Navarro-Jiménez & José V. Aguado & Grégoire Bazin & Vicente Albero & Domenico Borzacchiello, 2023. "Reconstruction of 3D surfaces from incomplete digitisations using statistical shape models for manufacturing processes," Journal of Intelligent Manufacturing, Springer, vol. 34(5), pages 2345-2358, June.
    12. Bikash Koli Dey & Hyesung Seok, 2024. "Intelligent inventory management with autonomation and service strategy," Journal of Intelligent Manufacturing, Springer, vol. 35(1), pages 307-330, January.
    13. Cheng Hao Jin & Hyun-Jin Kim & Yongjun Piao & Meijing Li & Minghao Piao, 2020. "Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes," Journal of Intelligent Manufacturing, Springer, vol. 31(8), pages 1861-1875, December.
    14. Xinyu Suo & Jian Liu & Licheng Dong & Chen Shengfeng & Lu Enhui & Chen Ning, 2022. "A machine vision-based defect detection system for nuclear-fuel rod groove," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1649-1663, August.
    15. Siyamalan Manivannan, 2023. "Automatic quality inspection in additive manufacturing using semi-supervised deep learning," Journal of Intelligent Manufacturing, Springer, vol. 34(7), pages 3091-3108, October.
    16. Chengjun Xu & Guobin Zhu, 2021. "Intelligent manufacturing Lie Group Machine Learning: real-time and efficient inspection system based on fog computing," Journal of Intelligent Manufacturing, Springer, vol. 32(1), pages 237-249, January.
    17. Jia Liu & Jiafeng Ye & Daniel Silva Izquierdo & Aleksandr Vinel & Nima Shamsaei & Shuai Shao, 2023. "A review of machine learning techniques for process and performance optimization in laser beam powder bed fusion additive manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 34(8), pages 3249-3275, December.
    18. Hong Seok Park & Dinh Son Nguyen & Thai Le-Hong & Xuan Tran, 2022. "Machine learning-based optimization of process parameters in selective laser melting for biomedical applications," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1843-1858, August.
    19. Diyi Zhou & Shihua Gong & Ziyue Wang & Delong Li & Huaiqing Lu, 2021. "Error analysis based on error transfer theory and compensation strategy for LED chip visual localization systems," Journal of Intelligent Manufacturing, Springer, vol. 32(5), pages 1345-1359, June.
    20. Abtin Djavadifar & John Brandon Graham-Knight & Marian Kӧrber & Patricia Lasserre & Homayoun Najjaran, 2022. "Automated visual detection of geometrical defects in composite manufacturing processes using deep convolutional neural networks," Journal of Intelligent Manufacturing, Springer, vol. 33(8), pages 2257-2275, December.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:spr:joinma:v:33:y:2022:i:5:d:10.1007_s10845-020-01730-7. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    If CitEc recognized a bibliographic reference but did not link an item in RePEc to it, you can help with this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sonal Shukla or Springer Nature Abstracting and Indexing (email available below). General contact details of provider: http://www.springer.com .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.