IDEAS home Printed from https://ideas.repec.org/a/spr/eurphb/v89y2016i3d10.1140_epjb_e2016-60974-0.html
   My bibliography  Save this article

A study of threshold effects in the energy loss of slow protons in semiconductors and insulators using dielectric and non-linear approaches

Author

Listed:
  • Claudio Darío Archubi

    (Instituto de Astronomía y Física del Espacio-Conicet, Ciudad Universitaria)

  • Nestor R. Arista

    (División Colisiones Atómicas, Centro Atómico Bariloche and Instituto Balseiro)

Abstract

The energy loss of slow protons in nonconducting materials, including semiconductors and insulators, is studied using different theoretical methods. First we apply two dielectric models proposed by Brandt and Reinheimer on one side, and by Levine and Louie on the other, and describe in detail the properties of individual and collective contributions according to each model. In addition, we perform an alternative calculation using a non-linear approach based on transport-cross-section methods. These different approaches are compared with experimental results for two semiconductors (Si and Ge) and two insulators (LiF and AlF3), obtaining an approximate description of threshold effects at very low energies. Some interesting similarities and discrepancies are found, which show the current limitations of the theoretical descriptions provided by these methods.

Suggested Citation

  • Claudio Darío Archubi & Nestor R. Arista, 2016. "A study of threshold effects in the energy loss of slow protons in semiconductors and insulators using dielectric and non-linear approaches," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 89(3), pages 1-6, March.
  • Handle: RePEc:spr:eurphb:v:89:y:2016:i:3:d:10.1140_epjb_e2016-60974-0
    DOI: 10.1140/epjb/e2016-60974-0
    as

    Download full text from publisher

    File URL: http://link.springer.com/10.1140/epjb/e2016-60974-0
    File Function: Abstract
    Download Restriction: Access to the full text of the articles in this series is restricted.

    File URL: https://libkey.io/10.1140/epjb/e2016-60974-0?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    More about this item

    Keywords

    Solid State and Materials;

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:spr:eurphb:v:89:y:2016:i:3:d:10.1140_epjb_e2016-60974-0. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sonal Shukla or Springer Nature Abstracting and Indexing (email available below). General contact details of provider: http://www.springer.com .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.