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X-ray photoelectron diffraction study of ultrathin PbTiO 3 films

Author

Listed:
  • L. Despont
  • C. Lichtensteiger
  • F. Clerc
  • M. G. Garnier
  • F.J. Garcia de Abajo
  • M. A. Van Hove
  • J.-M. Triscone
  • P. Aebi

Abstract

Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO 3 (PTO) films grown on Nb-doped SrTiO 3 substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 Å -thick PTO film. Multiple scattering theory based on a cluster-model [ Phys. Rev. B $\textbf{63}$ , 075404 (2001)] is used to simulate the experiments. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2006

Suggested Citation

  • L. Despont & C. Lichtensteiger & F. Clerc & M. G. Garnier & F.J. Garcia de Abajo & M. A. Van Hove & J.-M. Triscone & P. Aebi, 2006. "X-ray photoelectron diffraction study of ultrathin PbTiO 3 films," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 49(2), pages 141-146, January.
    • Handle: RePEc:spr:eurphb:v:49:y:2006:i:2:p:141-146
    DOI: 10.1140/epjb/e2006-00050-0
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