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Raman measurements on thin films of the La 0.7 Sr 0.3 MnO 3 manganite: a probe of substrate-induced effects

Author

Listed:
  • P. Dore
  • P. Postorino
  • A. Sacchetti
  • M. Baldini
  • R. Giambelluca
  • M. Angeloni
  • G. Balestrino

Abstract

We report on a Raman study of the phonon spectrum of La 0.7 Sr 0.3 MnO 3 thin films epitaxially grown on LaAlO 3 . The spectrum, as a function of film thickness d, does not change over the 1000–100 Å range, whereas a strong hardening of the phonon frequencies of both bending and stretching modes is apparent in ultra-thin films (d>100 Å) where substrate-induced effects are remarkable. This behaviour, which appears to be related with the measured d-dependence of the insulator-to-metal transition temperature, is ascribed to co-operative effects of MnO 6 octahedra rotation and charge-localization. Raman spectroscopy proves to be a simple and powerful tool to monitor subtle structural modifications hardly detectable with conventional diffraction techniques in ultra-thin films. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005

Suggested Citation

  • P. Dore & P. Postorino & A. Sacchetti & M. Baldini & R. Giambelluca & M. Angeloni & G. Balestrino, 2005. "Raman measurements on thin films of the La 0.7 Sr 0.3 MnO 3 manganite: a probe of substrate-induced effects," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 48(2), pages 255-258, November.
    • Handle: RePEc:spr:eurphb:v:48:y:2005:i:2:p:255-258
    DOI: 10.1140/epjb/e2005-00401-3
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