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Diffraction study of the piezoelectric properties of low quartz

Author

Listed:
  • R. Guillot
  • P. Fertey
  • N. Hansen
  • P. Allé
  • E. Elkaím
  • C. Lecomte

Abstract

The effect of a static electric field on the crystal structure of $\alpha $ -quartz has been determined by Xray diffraction on single crystals. By a stroboscopic technique rocking curves are measured quasi simultaneously for zero field and for two opposite strong fields (28.8 kV/cm) applied in the direction of the crystallographic a-axis. The relative intensity-changes of high order reflections (i.e. sensitive to the core electrons) were measured and analysed by a least squares method technique. The analysis indicates that the bond distances Si-O are very little affected by the field, but both a deformation and a reorientation of the SiO 4 tetrahedra are induced. The model is qualitatively in agreement with the small amplitudes of the induced polarisation and the piezoelectric coefficients. Copyright Springer-Verlag Berlin/Heidelberg 2004

Suggested Citation

  • R. Guillot & P. Fertey & N. Hansen & P. Allé & E. Elkaím & C. Lecomte, 2004. "Diffraction study of the piezoelectric properties of low quartz," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 42(3), pages 373-380, December.
    • Handle: RePEc:spr:eurphb:v:42:y:2004:i:3:p:373-380
    DOI: 10.1140/epjb/e2004-00393-4
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