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An ellipsometric investigation of Ag/SiO $\mathsf{_2}$ nanocomposite thin films

Author

Listed:
  • R. Roy
  • S. Mandal
  • D. Bhattacharyya
  • A. Pal

Abstract

Dielectric properties of silver/SiO 2 nanocomposite thin films grown by high-pressure d.c. sputtering technique were studied by spectroscopic ellipsometry (300-800 nm). The dielectric behavior of the nanocomposite thin films largely depended on the particle size, its number density and the surrounding environments. The films showed semiconductor-like behavior up to a critical particle size and concentration, beyond which the films exhibited the typical surface plasmon resonance characteristics in their optical properties. The refractive index was also found to have a strong dependence on the particle size and its dispersion in the matrix. The results were found to be consistent with those obtained from UV-VIS optical absorbance data. Bruggeman effective medium theory was used to explain the experimental results. Copyright Springer-Verlag Berlin/Heidelberg 2003

Suggested Citation

  • R. Roy & S. Mandal & D. Bhattacharyya & A. Pal, 2003. "An ellipsometric investigation of Ag/SiO $\mathsf{_2}$ nanocomposite thin films," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 34(1), pages 25-31, July.
  • Handle: RePEc:spr:eurphb:v:34:y:2003:i:1:p:25-31
    DOI: 10.1140/epjb/e2003-00192-5
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