IDEAS home Printed from https://ideas.repec.org/a/ids/ijrsaf/v4y2010i2-3p238-264.html
   My bibliography  Save this article

Designing accelerated life tests for generalised exponential distribution with log-linear model

Author

Listed:
  • Nesar Ahmad

Abstract

This paper discusses the optimal accelerated life test designs for Generalised Exponential (GE) distribution with log-linear model under periodic inspection and Type I censoring. For shape parameter, design and high test stresses, the accelerated life test is optimised with respect to the low test stress and the proportion of test units allocated to the low test stress. The asymptotic variance of the maximum likelihood estimator of log mean life or qth quantile at the design stress is derived as an optimality criterion with equally spaced inspection times and the optimal allocation of units for two stress levels are determined. Results show that the asymptotic variance at the design stress is insensitive to the number of inspection times and to misspecifications of guessed failure probabilities at design and high test stresses. Procedures for planning an accelerated life test, including selection of sample size, have been discussed through an example.

Suggested Citation

  • Nesar Ahmad, 2010. "Designing accelerated life tests for generalised exponential distribution with log-linear model," International Journal of Reliability and Safety, Inderscience Enterprises Ltd, vol. 4(2/3), pages 238-264.
    • Handle: RePEc:ids:ijrsaf:v:4:y:2010:i:2/3:p:238-264
    as

    Download full text from publisher

    File URL: http://www.inderscience.com/link.php?id=32447
    Download Restriction: Access to full text is restricted to subscribers.
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Showkat Ahmad Lone & Aquil Ahmed, 2021. "Design and Analysis of Accelerated Life Testing and its Application Under Rebate Warranty," Sankhya A: The Indian Journal of Statistics, Springer;Indian Statistical Institute, vol. 83(1), pages 393-407, February.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:ids:ijrsaf:v:4:y:2010:i:2/3:p:238-264. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sarah Parker (email available below). General contact details of provider: http://www.inderscience.com/browse/index.php?journalID=98 .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.