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Product failure root cause analysis during warranty analysis for integrated product design and quality improvement for early results in downturn economy

Author

Listed:
  • Sudripto De
  • Arindam Das
  • Ashish Sureka

Abstract

We present a Root Cause Analysis model for warranty failures that integrates the field failure data with the design improvement and internal quality-management data. Key features of the proposed model are: Ontology-Relationship-Diagram (ORD) to depict the Failure-Modes and Effect-Analysis (FMEA) data, conversion of ORD into a Bayesian Network (BN) in context to a Corrective Action Reports (CAR), usage of warranty claims data as the transactional data input to the BN to elicit probabilistic inference for warranty failure, application of text-processing technique for unstructured to structured data conversion. The benefits are reduction of Detection-To-Correction (DTC) cycle time and reduce liability exposure.

Suggested Citation

  • Sudripto De & Arindam Das & Ashish Sureka, 2010. "Product failure root cause analysis during warranty analysis for integrated product design and quality improvement for early results in downturn economy," International Journal of Product Development, Inderscience Enterprises Ltd, vol. 12(3/4), pages 235-253.
    • Handle: RePEc:ids:ijpdev:v:12:y:2010:i:3/4:p:235-253
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    Citations

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    Cited by:

    1. Santosh B. Rane & Yahya A. M. Narvel, 2016. "Reliability assessment and improvement of air circuit breaker (ACB) mechanism by identifying and eliminating the root causes," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 7(1), pages 305-321, December.
    2. Toyosi Ademujimi & Vittaldas Prabhu, 2024. "Model-Driven Bayesian Network Learning for Factory-Level Fault Diagnostics and Resilience," Sustainability, MDPI, vol. 16(2), pages 1-22, January.

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