A Novel ON-State Resistance Modeling Technique for MOSFET Power Switches

Nowadays, electronic circuits’ time to market is essential, with engineers trying to reduce it as much as possible. Due to this, simulation has become the main testing concept used in the electronics domain. In order to perform the simulation of a circuit, a behavioral model must be created. Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) are semiconductor devices found in a multitude of electronic circuits, and they are also used as power switches in many applications, such as low-dropout linear voltage regulators, switching regulators, gate drivers, battery management systems, etc. A MOSFETs’ behavior is extremely complex to model, thus, creating high-performance models for these transistors is an imperative condition in order to emulate the exact real behavior of a circuit using them. An essential parameter of MOSFET power switches is the ON-state resistance (RDS ON ), because it determines the power losses during the ON state. Ideally, the power losses need to be zero. RDS ON depends on multiple factors, such as temperature, load current, and gate-to-source voltage. Previous studies in this domain focus on the modeling of the MOSFET only in specific operating points, but do not cover the entire variation range of the parameters, which is critical for some applications. For this reason, in this paper, there was introduced for the first time a novel ON-state resistance modeling technique for MOSFET Power Switches, which solves the entire RDS ON dependency on the transistor’s variables stated above. The novel RDS ON modeling technique is based on modulating the transistor’s gate-to-source voltage such that the exact RDS ON value is obtained in each possible operating point. The method was tested as a real-life example by creating a behavioral model for an N-channel MOSFET transistor and the chosen simulation environment was Oregon, USA, Computer-Aided Design (OrCAD) capture. The results show that the model is able to match the transistor’s RDS ON characteristics with a maximum error of 0.8%. This is extremely important for applications in which the temperatures, voltages, and currents vary over a wide range. The new proposed modeling method covers a gap in the behavioral modeling domain, due to the fact that, until now, it was not possible to model the RDS ON characteristics in all operating corners.