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Statistical analysis as an aid to the revision of the International Patent Classification (IPC)

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  • Higham, P.A.

Abstract

Recent work is reported by the International Bureau of WIPO to determine whether statistical data, available from the International Patent Documentation Center (INPADOC), concerning the application of symbols of the International Patent Classification (IPC) to patent documents can be used as an aid to identifying areas of the IPC in need of revision. The results of two studies are given which highlight significant differences in the application of the IPC both at the section (or high) level as well as at the subgroup (or low) level.

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  • Higham, P.A., 1981. "Statistical analysis as an aid to the revision of the International Patent Classification (IPC)," World Patent Information, Elsevier, vol. 3(2), pages 73-78, April.
    • Handle: RePEc:eee:worpat:v:3:y:1981:i:2:p:73-78
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    Cited by:

    1. Kim, Yong Jin & Lee, Duk Hee, 2020. "Technology convergence networks for flexible display application: A comparative analysis of latecomers and leaders," Japan and the World Economy, Elsevier, vol. 55(C).

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