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Determination of the fractal dimension of equipotential surfaces in a region confined by rough conductors

Author

Listed:
  • de O. Dias Filho, H.
  • de Castilho, C.M.C.
  • Miranda, J.G.V.
  • Andrade, R.F.S.

Abstract

We consider a region bounded by two conductors held to a constant voltage bias, one of them with an irregular rough shape and the other being a flat one. The irregular profile can be either a curve with a formation rule or the result of a deposition process. The rough shape of the profile influences the equipotential lines, which we have characterized by numerically evaluating their roughness exponent α and fractal dimension Df. For a fixed finite size system, the less corrugated lines, far away from the rough profile, have higher α. For a line corresponding to a fixed value of the potential, the roughness exponent decreases with the size of the profile, suggesting that a single constant value characterizes all lines for an infinite system.

Suggested Citation

  • de O. Dias Filho, H. & de Castilho, C.M.C. & Miranda, J.G.V. & Andrade, R.F.S., 2004. "Determination of the fractal dimension of equipotential surfaces in a region confined by rough conductors," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 342(1), pages 388-394.
    • Handle: RePEc:eee:phsmap:v:342:y:2004:i:1:p:388-394
    DOI: 10.1016/j.physa.2004.04.099
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