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Analysis for constant-stress model on multicomponent system from generalized inverted exponential distribution with stress dependent parameters

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  • Wang, Liang
  • Wu, Shuo-Jye
  • Zhang, Chunfang
  • Dey, Sanku
  • Tripathi, Yogesh Mani

Abstract

In this paper, inference of multicomponent system is presented under constant-stress accelerated life test. When the lifetime of the components of the multicomponent system follows a generalized inverted exponential distribution (GIED), different from standard extrapolation approach where only the scale parameter depends on the stress conditions, a life-stress model is proposed assuming that both parameters of the GIED are nonconstant and depend on the stress. The model parameters are estimated along with the existence and uniqueness via maximum likelihood method, and the survival function of the multicomponent system is extrapolated at normal use condition. The approximate confidence intervals are further constructed using the asymptotic distribution theory and delta technique. Furthermore, another alternative generalized estimates are also constructed by using proposed pivotal quantities for comparison. In addition, likelihood ratio testing is presented as a complementary by comparing the life-stress models with nonconstant and constant parameters. Finally, simulation studies and a real data example are carried out for illustrations, and the results indicates that the proposed generalized approach is superior to conventional likelihood estimation.

Suggested Citation

  • Wang, Liang & Wu, Shuo-Jye & Zhang, Chunfang & Dey, Sanku & Tripathi, Yogesh Mani, 2022. "Analysis for constant-stress model on multicomponent system from generalized inverted exponential distribution with stress dependent parameters," Mathematics and Computers in Simulation (MATCOM), Elsevier, vol. 193(C), pages 301-316.
    • Handle: RePEc:eee:matcom:v:193:y:2022:i:c:p:301-316
    DOI: 10.1016/j.matcom.2021.10.017
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    References listed on IDEAS

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    1. Ling, M.H. & Hu, X.W., 2020. "Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions," Reliability Engineering and System Safety, Elsevier, vol. 193(C).
    2. L.C. Tang & T.N. Goh & Y.S. Sun & H.L. Ong, 1999. "Planning accelerated life tests for censored two‐parameter exponential distributions," Naval Research Logistics (NRL), John Wiley & Sons, vol. 46(2), pages 169-186, March.
    3. Sanku Dey & Tanujit Dey, 2014. "On progressively censored generalized inverted exponential distribution," Journal of Applied Statistics, Taylor & Francis Journals, vol. 41(12), pages 2557-2576, December.
    4. Wu, Shuo-Jye & Huang, Syuan-Rong, 2017. "Planning two or more level constant-stress accelerated life tests with competing risks," Reliability Engineering and System Safety, Elsevier, vol. 158(C), pages 1-8.
    5. Dey, Sanku & Dey, Tanujit & Luckett, Daniel J., 2016. "Statistical inference for the generalized inverted exponential distribution based on upper record values," Mathematics and Computers in Simulation (MATCOM), Elsevier, vol. 120(C), pages 64-78.
    6. Seo, J.H. & Jung, M. & Kim, C.M., 2009. "Design of accelerated life test sampling plans with a nonconstant shape parameter," European Journal of Operational Research, Elsevier, vol. 197(2), pages 659-666, September.
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