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Advanced Data Analytical Techniques for Profile Monitoring

Author

Listed:
  • Peiyao Liu

    (Tsinghua University)

  • Chen Zhang

    (Tsinghua University)

Abstract

Nowadays advanced sensing technology enables high-resolution in-process data collection during manufacturing, known as profiles or functional data. These data facilitate in-process monitoring and anomaly detection, which have been extensively studied in recent years. Yet three main challenges are the most essential: (i) how to model complex correlation structures of high-dimensional profiles, i.e., cluster-correlated or sparse-correlated profiles, (ii) how to efficiently detect changes before the profile is complete, and (iii) how to characterize the between-stage correlation of multi-stage profiles. To address these three challenges, we accordingly develop three techniques for high-dimensional profile monitoring, in-profile monitoring, and multi-stage profile monitoring.

Suggested Citation

  • Peiyao Liu & Chen Zhang, 2024. "Advanced Data Analytical Techniques for Profile Monitoring," Springer Optimization and Its Applications,, Springer.
    • Handle: RePEc:spr:spochp:978-3-031-53092-0_3
    DOI: 10.1007/978-3-031-53092-0_3
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