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On the Long-Run Variance Ratio Test for a Unit Root

Author

Listed:
  • Ye Cai

    (Graduate Student, Department of Economics, Vanderbilt University)

  • Mototsugu Shintani

    (Department of Economics, Vanderbilt University)

Abstract

This paper investigates the effects of consistent and inconsistent long-run variance estimation on a unit root test based on the generalization of the von Neumann ratio. The results from the Monte Carlo experiments suggest that the tests based on an inconsistent estimator have less size distortion and more stability of size across different autocorrelation specifications as compared to the tests based on a consistent estimator. This improvement in size property, however, comes at the cost of a loss in power. The finite sample power, as well as the local asymptotic power, of the tests with an inconsistent estimator is shown to be much lower than that of conventional tests. This finding resembles the case of the autocorrelation robust test in the standard regression context. The paper also points out that combining consistent and inconsistent estimators in the long-run variance ratio test for a unit root is one possibility of balancing the size and power.

Suggested Citation

  • Ye Cai & Mototsugu Shintani, 2005. "On the Long-Run Variance Ratio Test for a Unit Root," Vanderbilt University Department of Economics Working Papers 0506, Vanderbilt University Department of Economics.
    • Handle: RePEc:van:wpaper:0506
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    References listed on IDEAS

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    More about this item

    Keywords

    Bandwidth; local asymptotic power; von Neumann ratio;
    All these keywords.

    JEL classification:

    • C12 - Mathematical and Quantitative Methods - - Econometric and Statistical Methods and Methodology: General - - - Hypothesis Testing: General
    • C22 - Mathematical and Quantitative Methods - - Single Equation Models; Single Variables - - - Time-Series Models; Dynamic Quantile Regressions; Dynamic Treatment Effect Models; Diffusion Processes

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