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On the Long-Run Variance Ratio Test for a Unit Root Author info | Abstract | Publisher info | Download info | Related research | Statistics Ye Cai () (Graduate Student, Department of Economics, Vanderbilt University)
Mototsugu Shintani () (Department of Economics, Vanderbilt University)
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This paper investigates the effects of consistent and inconsistent long-run variance estimation on a unit root test based on the generalization of the von Neumann ratio. The results from the Monte Carlo experiments suggest that the tests based on an inconsistent estimator have less size distortion and more stability of size across different autocorrelation specifications as compared to the tests based on a consistent estimator. This improvement in size property, however, comes at the cost of a loss in power. The finite sample power, as well as the local asymptotic power, of the tests with an inconsistent estimator is shown to be much lower than that of conventional tests. This finding resembles the case of the autocorrelation robust test in the standard regression context. The paper also points out that combining consistent and inconsistent estimators in the long-run variance ratio test for a unit root is one possibility of balancing the size and power.
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Paper provided by Department of Economics, Vanderbilt University in its series Working Papers with number
0506.
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Date of creation: Mar 2005Date of revision:
Handle: RePEc:van:wpaper:0506Contact details of provider: Postal: Box 1819, Station B, Nashville, TN 37235 Fax: 615-343-8495 Email: Web page: http://sitemason.vanderbilt.edu/econ/ More information through EDIRC
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Keywords: Bandwidth local asymptotic power von Neumann ratio Find related papers by JEL classification: C12 - Mathematical and Quantitative Methods - - Econometric and Statistical Methods: General - - - Hypothesis Testing C22 - Mathematical and Quantitative Methods - - Single Equation Models; Single Variables - - - Time-Series Models
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