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How to measure patent thickets – a novel approach

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Author Info
Graevenitz, Georg von
Wagner, Stefan
Harhoff, Dietmar

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Abstract

The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.

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File URL: http://epub.ub.uni-muenchen.de/10962/2/vonGraevenitz_Harhoff_Wagner_09.pdf
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Publisher Info
Paper provided by University of Munich, Munich School of Management in its series Discussion Papers in Business Administration with number 10962.

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Date of creation: 15 Jun 2009
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Handle: RePEc:lmu:msmdpa:10962

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Related research
Keywords: patenting; patent thickets; patent portfolio races; complexity;

Find related papers by JEL classification:
L13 - Industrial Organization - - Market Structure, Firm Strategy, and Market Performance - - - Oligopoly and Other Imperfect Markets
L20 - Industrial Organization - - Firm Objectives, Organization, and Behavior - - - General
O34 - Economic Development, Technological Change, and Growth - - Technological Change - - - Intellectual Property Rights

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This page was last updated on 2009-11-17.

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