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Forecasting Value-at-Risk Using Nonlinear Regression Quantiles and the Intra-day Range

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Author Info

  • Cathy W. S. Chen

    (Graduate Institute of Statistics and Actuarial Science, Feng Chia University)

  • Richard Gerlach

    (University of Sydney Business School)

  • Bruce B. K. Hwang

    (Graduate Institute of Statistics and Actuarial Science, Feng Chia University)

  • Michael McAleer

    (Erasmus University Rotterdam, Tinbergen Institute, The Netherlands, Complutense University of Madrid, and Institute of Economic Research, Kyoto University)

Abstract

Value-at-Risk (VaR) is commonly used for financial risk measurement. It has recently become even more important, especially during the 2008-09 global financial crisis. We pro- pose some novel nonlinear threshold conditional autoregressive VaR (CAViaR) models that incorporate intra-day price ranges. Model estimation and inference are performed using the Bayesian approach via the link with the Skewed-Laplace distribution. We examine how a range of risk models perform during the 2008-09 financial crisis, and evaluate how the crisis affects the performance of risk models via forecasting VaR. Empirical analysis is conducted on five Asia-Pacific Economic Cooperation stock market indices as well as two exchange rate series. We examine violation rates, back-testing criteria, market risk charges and quantile loss function values to measure and assess the forecasting performance of a variety of risk models. The proposed threshold CAViaR model, incorporating range information, is shown to forecast VaR more efficiently than other models, across the series considered, which should be useful for financial practitioners.

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Bibliographic Info

Paper provided by Kyoto University, Institute of Economic Research in its series KIER Working Papers with number 775.

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Length: 40pages
Date of creation: May 2011
Date of revision:
Handle: RePEc:kyo:wpaper:775

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Keywords: Value-at-Risk; CAViaR model; Skewed-Laplace distribution; intra-day range; backtesting; Markov chain Monte Carlo.;

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References

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