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Valuable Patents Author info | Abstract | Publisher info | Download info | Related research | Statistics John Allison (University of Texas, Austin)
Mark Lemley (Boalt Hall School of Law, UC Berkeley)
Kimberly Moore (George Mason University, Law School)
Derek Trunkey (George Mason University Law School)
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Paper provided by Berkeley Olin Program in Law & Economics in its series Berkeley Olin Program in Law & Economics, Working Paper Series with number
1090.
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Date of creation: 01 Jun 2003Date of revision:
Handle: RePEc:cdl:oplwec:1090Note: oai:cdlib1:blewp-1090Contact details of provider: Postal: Boalt Hall, Berkeley, CA 94720 Fax: (510) 642-3767 Email: Web page: http://repositories.cdlib.org/blewp/ More information through EDIRC
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Cited by : (explanations , Please report citation or reference errors to , or , if you are the registered author of the cited work, log in to your RePEc Author Service profile , click on "citations" and make appropriate adjustments.)Hirukawa, Masayuki & Ueda, Masako, 2008.
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wp2005n05, Melbourne Institute of Applied Economic and Social Research, The University of Melbourne.
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Bronwyn H. Hall & Stuart J. H. Graham & Dietmar Harhoff & David C. Mowery, 2004.
"Prospects for Improving U.S. Patent Quality via Post-grant Opposition ,"
Law and Economics
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Other versions:
Bronwyn Hall & Stuart Graham & Dietmar Harhoff & David Mowery, 2003.
"Prospects for Improving U.S. Patent Quality via Post-grant Opposition ,"
Department of Economics, Working Paper Series
1054, Department of Economics, Institute for Business and Economic Research, UC Berkeley.
[Downloadable!] Bronwyn H. Hall & Stuart J.H. Graham & Dietmar Harhoff, 2003.
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NBER Working Papers
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[Downloadable!] (restricted) Bronwyn H. Hall & Stuart Graham & Dietmar Harhoff & David C. Mowery, 2004.
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NBER Chapters ,
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[Downloadable!] Nicolas van Zeebroeck, 2007.
"The puzzle of patent value indicators ,"
Working Papers CEB
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Nicolas van Zeebroeck, 2007.
"Patents only live twice: a patent survival analysis in Europe ,"
Working Papers CEB
07-028.RS, Université Libre de Bruxelles, Solvay Brussels School of Economics and Management, Centre Emile Bernheim (CEB).
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Juan Alcacer & Michelle Gittelman & Bhaven Sampat, 2008.
"Applicant and Examiner Citations in US Patents: An Overview and Analysis ,"
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repec:bep:eaptop:v:4:y:2004:i:1:p:1226-1226 is not listed on IDEAS
Other versions: Marco, Alan C., 2006.
"The Value of Certainty in Intellectual Property Rights: Stock Market Reactions to Patent Litigation ,"
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82, Vassar College Department of Economics.
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