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HIGH-RESOLUTION ANGLE-RESOLVED PHOTOEMISSION STUDY OFBaCo1-xNixS2

Author

Listed:
  • T. SATO

    (Department of Physics, Tohoku University, Sendai 980-8578, Japan)

  • H. KUMIGASHIRA

    (Department of Physics, Tohoku University, Sendai 980-8578, Japan)

  • D. IONEL

    (Department of Physics, Tohoku University, Sendai 980-8578, Japan)

  • T. ITO

    (Department of Physics, Tohoku University, Sendai 980-8578, Japan)

  • T. TAKAHASHI

    (Department of Physics, Tohoku University, Sendai 980-8578, Japan)

  • I. HASE

    (Electrotechnical Laboratory, Tsukuba 305-8568, Japan)

  • H. DING

    (Department of Physics, Boston College, Chestnut Hill, Massachusetts 02467, USA)

  • J. C. CAMPUZANO

    (Department of Physics, University of Illinois at Chicago, Chicago, Illinois 60607, USA;
    Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA)

  • S. SHAMOTO

    (Department of Applied Physics, Tohoku University, Sendai 980-8579, Japan)

Abstract

We have performed angle-resolved photoemission spectroscopy on a layered Mott systemBaCo1-xNixS2across the phase transition from the antiferromagnetic insulator(x = 0.18)to anomalous metal(x = 0.28). In the anomalous metallic phase, we found a large Fermi surface centered at the M(A) point with a dominant Co (Ni)3d3z2-r2character. Hubbard bands in the insulating phase have a remnant of Fermi surface in the metallic phase and gradually evolve into metallic dispersive bands upon carrier doping. We conclude that the electronic structure ofBaCo1 - xNixS2is basically different from that of the high-Tccuprates although the transport and magnetic properties share some common features between the two layered compounds.

Suggested Citation

  • T. Sato & H. Kumigashira & D. Ionel & T. Ito & T. Takahashi & I. Hase & H. Ding & J. C. Campuzano & S. Shamoto, 2002. "HIGH-RESOLUTION ANGLE-RESOLVED PHOTOEMISSION STUDY OFBaCo1-xNixS2," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 9(02), pages 1127-1132.
  • Handle: RePEc:wsi:srlxxx:v:09:y:2002:i:02:n:s0218625x02003627
    DOI: 10.1142/S0218625X02003627
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