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Connections between uniformity and aberration in general multi-level factorials


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  • Fasheng Sun
  • Jie Chen
  • Min-Qian Liu


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    Bibliographic Info

    Article provided by Springer in its journal Metrika.

    Volume (Year): 73 (2011)
    Issue (Month): 3 (May)
    Pages: 305-315

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    Handle: RePEc:spr:metrik:v:73:y:2011:i:3:p:305-315

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    Related research

    Keywords: Discrepancy; Generalized minimum aberration; Generalized wordlength pattern; Indicator function; Uniformity;


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    1. Min-Qian Liu & Fred Hickernell, 2006. "The Relationship Between Discrepancies Defined on a Domain and on its Subset," Metrika, Springer, vol. 63(3), pages 317-327, June.
    2. Fred J. Hickernell, 2002. "Uniform designs limit aliasing," Biometrika, Biometrika Trust, vol. 89(4), pages 893-904, December.
    3. Kai-Tai Fang & Dennis K. J. Lin & Min-Qian Liu, 2003. "Optimal mixed-level supersaturated design," Metrika, Springer, vol. 58(3), pages 279-291, December.
    4. Hong Qin & Mingyao Ai, 2007. "A note on the connection between uniformity and generalized minimum aberration," Statistical Papers, Springer, vol. 48(3), pages 491-502, September.
    5. Fang, Kai-Tai & Qin, Hong, 2003. "A note on construction of nearly uniform designs with large number of runs," Statistics & Probability Letters, Elsevier, vol. 61(2), pages 215-224, January.
    6. Hong Qin & Kai-Tai Fang, 2004. "Discrete discrepancy in factorial designs," Metrika, Springer, vol. 60(1), pages 59-72, 07.
    7. Hong Qin & Na Zou & Kashinath Chatterjee, 2009. "Connection between uniformity and minimum moment aberration," Metrika, Springer, vol. 70(1), pages 79-88, June.
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