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X-ray detected ferromagnetic resonance in thin films

Author

Listed:
  • J. Goulon
  • A. Rogalev
  • F. Wilhelm
  • N. Jaouen
  • C. Goulon-Ginet
  • Ch. Brouder

Abstract

We discuss the physical content of X-ray Detected Magnetic Resonance (XDMR), i.e. a novel spectroscopy which uses XMCD to probe the resonant precession of the local magnetization in a strong microwave pump field. We focus on the simplest case of a steady-state precession of elemental moments in the non-linear regime of angular foldover. Like XMCD, XDMR is element and edge selective and could become a unique tool to investigate how precessional dynamics can locally affect the spin and orbital magnetization of p- or d-projected DOS. This should be possible only in the limit where there is no overdamping due to ultrafast orbit-lattice relaxation. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2006

Suggested Citation

  • J. Goulon & A. Rogalev & F. Wilhelm & N. Jaouen & C. Goulon-Ginet & Ch. Brouder, 2006. "X-ray detected ferromagnetic resonance in thin films," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 53(2), pages 169-184, September.
    • Handle: RePEc:spr:eurphb:v:53:y:2006:i:2:p:169-184
    DOI: 10.1140/epjb/e2006-00367-6
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