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Synchrotron X-ray diffraction study of SrRuO 3 /SrTiO 3 /SrRuO 3 nano-sized heterostructures grown by laser MBE

Author

Listed:
  • C. Aruta
  • M. Angeloni
  • G. Balestrino
  • P. G. Medaglia
  • P. Orgiani
  • A. Tebano
  • J. Zegenhagen

Abstract

Structural investigation using X-ray synchrotron radiation has been performed on SrRuO 3 /SrTiO 3 /SrRuO 3 epitaxial heterostructures, with each constituent layer a few unit cell thick grown on (001) SrTiO 3 substrate. Detailed information on the evolution of the in-plane lattice structure has been obtained, in these heterostructures, by grazing incidence diffraction measurements. The samples have been grown by low-pressure pulsed laser deposition. Under our deposition conditions, SrRuO 3 layers grow with an elongated cell perpendicular to the substrate surface. The in-plane pseudocubic lattice parameters do not match the in-plane square SrTiO 3 structure even in the case of very thin SrRuO 3 layers. Such a distortion was found to decrease with increasing the thickness of the SrTiO 3 barrier layer. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005

Suggested Citation

  • C. Aruta & M. Angeloni & G. Balestrino & P. G. Medaglia & P. Orgiani & A. Tebano & J. Zegenhagen, 2005. "Synchrotron X-ray diffraction study of SrRuO 3 /SrTiO 3 /SrRuO 3 nano-sized heterostructures grown by laser MBE," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 46(2), pages 251-255, July.
    • Handle: RePEc:spr:eurphb:v:46:y:2005:i:2:p:251-255
    DOI: 10.1140/epjb/e2005-00248-6
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