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Exchange bias on epitaxial Ni films due to ultrathin NiO layer

Author

Listed:
  • R. A. Lukaszew
  • M. Mitra
  • Z. Zhang
  • M. Yeadon

Abstract

Exchange anisotropy refers to the effect that an antiferromagnetic (AF) layer grown in contact with a ferromagnetic (FM) layer has on the magnetic response of the FM layer. The most notable changes in the FM hysteresis loop due to the surface exchange coupling are a coercivity enhanced over the value typically observed in films grown on a nonmagnetic substrate, and a shift in the hysteresis loop of the ferromagnet away from the zero field axis. A typical observation is that the thickness of the antiferromagnet needs to exceed a critical value before exchange bias is observed. Here we report on the exchange bias properties observed in an epitaxial Ni/NiO system where a thin NiO layer forms spontaneously and is observed after annealing epitaxial Ni films MBE grown on MgO substrates. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005

Suggested Citation

  • R. A. Lukaszew & M. Mitra & Z. Zhang & M. Yeadon, 2005. "Exchange bias on epitaxial Ni films due to ultrathin NiO layer," The European Physical Journal B: Condensed Matter and Complex Systems, Springer;EDP Sciences, vol. 45(2), pages 181-184, May.
    • Handle: RePEc:spr:eurphb:v:45:y:2005:i:2:p:181-184
    DOI: 10.1140/epjb/e2005-00183-6
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