A class of multi-sample nonparametric tests for panel count data
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Bibliographic InfoArticle provided by Springer in its journal Annals of the Institute of Statistical Mathematics.
Volume (Year): 63 (2011)
Issue (Month): 1 (February)
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Web page: http://www.springerlink.com/link.asp?id=102845
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- Jianguo Sun, 2003. "A nonparametric test for panel count data," Biometrika, Biometrika Trust, vol. 90(1), pages 199-208, March.
- J. Sun & L. J. Wei, 2000. "Regression analysis of panel count data with covariate-dependent observation and censoring times," Journal of the Royal Statistical Society Series B, Royal Statistical Society, vol. 62(2), pages 293-302.
- Ying Zhang, 2002. "A semiparametric pseudolikelihood estimation method for panel count data," Biometrika, Biometrika Trust, vol. 89(1), pages 39-48, March.
- X. Joan Hu & Jianguo Sun & Lee-Jen Wei, 2003. "Regression Parameter Estimation from Panel Counts," Scandinavian Journal of Statistics, Danish Society for Theoretical Statistics;Finnish Statistical Society;Norwegian Statistical Association;Swedish Statistical Association, vol. 30(1), pages 25-43.
- Li, Yang & Zhao, Hui & Sun, Jianguo & Kim, KyungMann, 2014. "Nonparametric tests for panel count data with unequal observation processes," Computational Statistics & Data Analysis, Elsevier, vol. 73(C), pages 103-111.
- Zhang, Haixiang & Zhao, Hui & Sun, Jianguo & Wang, Dehui & Kim, KyungMann, 2013. "Regression analysis of multivariate panel count data with an informative observation process," Journal of Multivariate Analysis, Elsevier, vol. 119(C), pages 71-80.
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