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Spectroscopic transmission ellipsometry studies of semiconductor heterostructures

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  • Ozanyan, K.B.
  • Hunderi, O.

Abstract

Ellipsometry is conventionally used in a reflection configuration, which however is not suitable for the case of p-polarization sensitive modes in high-index samples. In this paper we demonstrate that transmission ellipsometry at the Brewster angle of incidence can be a powerful tool for investigating heterostructures and superlattices, provided s-polarized absorption is negligible. Such a geometry combines the possibility of achieving a greater p-polarized component in the sample, the convinience of measuring at higher signal levels and easier treatment of experimental data.

Suggested Citation

  • Ozanyan, K.B. & Hunderi, O., 1994. "Spectroscopic transmission ellipsometry studies of semiconductor heterostructures," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 207(1), pages 420-426.
  • Handle: RePEc:eee:phsmap:v:207:y:1994:i:1:p:420-426
    DOI: 10.1016/0378-4371(94)90404-9
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