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Bayesian inspection model with the negative binomial prior in the presence of inspection errors

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Author Info
Chun, Young H.
Sumichrast, Robert T.
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File URL: http://www.sciencedirect.com/science/article/B6VCT-4MJS038-3/2/a7594afdc0e4c904acfde941bb076698
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Article provided by Elsevier in its journal European Journal of Operational Research.

Volume (Year): 182 (2007)
Issue (Month): 3 (November)
Pages: 1188-1202
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Handle: RePEc:eee:ejores:v:182:y:2007:i:3:p:1188-1202

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